Spatially resolved probing of Preisach density in polycrystalline ferroelectric thin films
Spatially resolved probing of Preisach density in polycrystalline ferroelectric thin films
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DOI：
10.1063/1.3493738
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发表时间：
2010-10-15
影响因子：
3.2
通讯作者：
Kalinin, S. V.
中科院分区：
文献类型：
--
作者：
Guo, S.;Ovchinnikov, O. S.;Kalinin, S. V.
铁电材料在信息存储中的应用需要在单个晶粒和微结构元素水平上理解局部开关行为。特别是，多级神经形态元素的实现需要了解历史相关的极化响应。在这里，我们介绍了空间分辨的方法映射局部Preisach密度在多晶铁电体的基础上的一阶反转曲线（FORC）的测量空间分辨网格的压电响应力谱使用尖端电极。带激励方法允许有效地使用悬臂梁共振放大弱压电信号，并提供了洞察力的位置，电压和电压历史依赖的机械性能的尖端表面接触。介绍并比较了几种用于由FORC族或Preisach密度在每个点形成的多维数据集的可视化和比较的方法。分析了开关行为与微结构的关系。(C)2010年美国物理学会。[doi：10.1063/1.3493738]
Applications of the ferroelectric materials for the information storage necessitate the understanding of local switching behavior on the level of individual grains and microstructural elements. In particular, implementation of multilevel neuromorphic elements requires the understanding of history-dependent polarization responses. Here, we introduce the spatially resolved approach for mapping local Preisach densities in polycrystalline ferroelectrics based on first-order reversal curve (FORC) measurements over spatially resolved grid by piezoresponse force spectroscopy using tip-electrode. The band excitation approach allowed effective use of cantilever resonances to amplify weak piezoelectric signal and also provided insight in position-, voltage-, and voltage history-dependent mechanical properties of the tip-surface contact. Several approaches for visualization and comparison of the multidimensional data sets formed by FORC families or Preisach densities at each point are introduced and compared. The relationship between switching behavior and microstructure is analyzed. (C) 2010 American Institute of Physics. [doi:10.1063/1.3493738]