Characterization, Selection, and Microassembly of Nanowire Laser Systems
Characterization, Selection, and Microassembly of Nanowire Laser Systems
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纳米线激光系统的表征、选择和微组装
DOI：
10.1021/acs.nanolett.9b05078
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发表时间：
2020-03-11
期刊：
影响因子：
10.8
通讯作者：
Strain, Michael J.
中科院分区：
文献类型：
--
作者：
Jevtics, Dimitars;McPhillimy, John;Strain, Michael J.
半导体纳米线激光器是实现超小尺寸相干光源的一种很有前途的技术。为了充分发挥它们在片上光子系统中的潜力，需要可扩展的方法来处理大量非均匀设备，这些设备通常随机分布在主机衬底上。在这项工作中，两个互补的，高通量的技术相结合：纳米线激光人口的表征，使用自动光学显微镜，和高精度的转印过程与自动设备空间配准和转移。在此，NW激光器的群体被表征，通过阈值能量密度分箱，并且随后以阵列印刷到次级基板上。转移和控制设备的统计分析表明，转移过程中不会产生可测量的激光损伤，阈值装仓可以保持。对器件布居的阈值和模谱的分析证明了使用NW激光器进行集成系统制造的潜力。
Semiconductor nanowire (NW) lasers are a promising technology for the realization of coherent optical sources with ultrasmall footprint. To fully realize their potential in on-chip photonic systems, scalable methods are required for dealing with large populations of inhomogeneous devices that are typically randomly distributed on host substrates. In this work two complementary, high-throughput techniques are combined: the characterization of nanowire laser populations using automated optical microscopy, and a high-accuracy transfer-printing process with automatic device spatial registration and transfer. Here, a population of NW lasers is characterized, binned by threshold energy density, and subsequently printed in arrays onto a secondary substrate. Statistical analysis of the transferred and control devices shows that the transfer process does not incur measurable laser damage, and the threshold binning can be maintained. Analysis on the threshold and mode spectra of the device populations proves the potential for using NW lasers for integrated systems fabrication.