The growth and dislocation characterization of Yb0.005Y0.848Lu0.147VO4 mixed laser crystal
The growth and dislocation characterization of Yb0.005Y0.848Lu0.147VO4 mixed laser crystal
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Yb0.005Y0.848Lu0.147VO4混合激光晶体的生长和位错表征
DOI:
10.1002/crat.201400120
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发表时间:
2014
影响因子:
1.5
通讯作者:
You Peng
中科院分区:
文献类型:
--
作者:
Zhang Shiming;Teng Bing;Zhong Degao;Zhang Bingtao;Wang Chao;Li Yu-yi;Yang Liting;You Peng
A new mixed laser crystal, Yb0.005Y0.848Lu0.147VO4, has been successfully grown using the Czochralski method. An ICP‐OES was used to measure the concentrations of elements (Yb, Y, Lu, V) in the crystal, and the chemical formula was determined. X‐ray powder diffraction analysis shows that the crystal has ZrSiO4structure. A pair of edge dislocations with certain orientation was observed by the HREM, and the orientation was confirmed by the calibration of the diffraction spots. The formation mechanism of this type dislocation was given by analysis on structure and thermal expansion of crystal. The suggestion to avoid these dislocations was also given.