Stochastic EMI sources localization based on ultra wide band near-field measurements
Stochastic EMI sources localization based on ultra wide band near-field measurements
复制标题
基于超宽带近场测量的随机 EMI 源定位
DOI：
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发表时间：
2013
期刊：
影响因子：
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通讯作者：
J. Russer
中科院分区：
文献类型：
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作者：
A. Baev;A. Gorbunova;M. Konovalyuk;Y. Kuznetsov;J. Russer
提出了一种基于电磁近场切向分量时域测量的随机电磁干扰源定位技术。利用两点平面扫描系统得到的自相关函数和互相关函数对随机场分布进行表征。讨论了扫描参数的主要限制。在建模和测量结果的基础上，对等效点源的频率和空间定位进行了实例研究。
A localization technique for stochastic EMI sources based on time domain measurements of EM near-field tangential components is presented. The autocorrelation and cross-correlation functions obtained by using the two-point planar scanning system are used for the characterization of stochastic field distribution. The main limitations for scanning parameters are discussed. The case study for a frequency and spatial localizations of equivalent point sources is presented based on the modeling and measurement results.