High sensitive and wide detecting range MOS tunneling temperature sensors for on-chip temperature detection
High sensitive and wide detecting range MOS tunneling temperature sensors for on-chip temperature detection
复制标题
用于片上温度检测的高灵敏度、宽检测范围 MOS 隧道温度传感器
DOI:
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发表时间:
2004
期刊:
影响因子:
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通讯作者:
J. Hwu
中科院分区:
文献类型:
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作者:
Y. Shih;Shian;Tsung;J. Hwu
This paper examined the feasibility of applying a highly sensitive metal-oxide-semiconductor (MOS) tunneling temperature sensor, which was compatible with current CMOS technology. As the sensor was biased positively at a constant voltage, the gate current increased more than 500 times when the sensor was heated from 20/spl deg/C to 110/spl deg/C. However, when the sensor was biased at a constant-current situation, its gate voltage magnitude changed significantly with substrate temperature, with a sensitivity exceeding -2 V//spl deg/C. The improvement of temperature sensitivity in this paper is one thousand times over the sensitivity of a conventional p-n junction, i.e., namely, about -2 mV//spl deg/C. Regarding a temperature sensor array, this paper proposes a method using gate current gain, rather than absolute gate current, to eliminate the gate current discrepancy among sensors. For constant current operation, a sensitivity exceeding 10 V//spl deg/C can be obtained if the current level is suitable. Finally, this paper demonstrates a real temperature distribution for on-chip detection. With such a high temperature-sensitive sensor, accurate temperature detection can be incorporated into common CMOS circuits.