Comparative study of effects of Mo and W dopants on the ferroelectric property of Pb(Zr0.3Ti0.7) thin films
Comparative study of effects of Mo and W dopants on the ferroelectric property of Pb(Zr0.3Ti0.7) thin films
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DOI：
10.1088/0022-3727/41/13/135402
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发表时间：
2008-07
期刊：
影响因子：
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通讯作者：
Zhen Zhang;Shijie Wang;W. Song;Li Lu;C. Shu;P. Wu
中科院分区：
文献类型：
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作者：
Zhen Zhang;Shijie Wang;W. Song;Li Lu;C. Shu;P. Wu
采用脉冲激光沉积法在LaNiO3底电极上制备了掺杂1mol%W和1mol%Mo的Pb（Zr0.3Ti0.7）O3薄膜。X射线衍射分析表明，这两种掺杂剂诱导的钙钛矿结构的（1 1 0）取向。与未掺杂的PZT薄膜相比，掺杂的PZT薄膜表现出更光滑、更致密的表面。XPS测试表明，在PZTW薄膜中，W以+6价态存在，而Mo以+4价态和+6价态混合存在。获得了未掺杂、W掺杂（PZTW）和Mo掺杂（PZTM）PZT薄膜的滞后回线和疲劳结果。虽然这两种掺杂的膜显示出比未掺杂的PZT更好的疲劳行为，但PZTW膜与PZTM膜相比具有缓慢的疲劳速率，这与我们先前的理论预测一致。
Pb(Zr0.3Ti0.7)O3 thin films, respectively, doped with 1 mol% W and 1 mol% Mo have been deposited on the LaNiO3 bottom electrodes using pulse laser deposition. The x-ray diffraction analyses revealed that both dopants induced (1 1 0) orientation of the perovskite structures. Compared with the undoped PZT films, the doped PZT films showed smoother and denser surfaces. The XPS measurements indicated that W possessed a valence state of +6 in the PZTW films, but Mo showed mixed valence states of +4 and +6. The hysteresis loops and fatigue results of the undoped, the W-doped (PZTW) and the Mo-doped PZT (PZTM) films were obtained. While both the two doped films revealed better fatigue behaviour than undoped PZT, the PZTW film had a slow fatigue rate in comparison with the PZTM film, which is consistent with our previous theoretical predictions.