Examination of depth profile of molecular orientation in L&S pattern fabricated by nanoimprint-graphoepitaxy
Examination of depth profile of molecular orientation in L&S pattern fabricated by nanoimprint-graphoepitaxy
复制标题
L 中分子取向的深度剖面检查
DOI:
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发表时间:
2016
期刊:
影响因子:
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通讯作者:
and Shinji Matsui
中科院分区:
文献类型:
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作者:
Makoto Okada;Ryosuke Fujii;Yuichi Haruyama;Hiroshi Ono;Nobuhiro Kawatsuki;and Shinji Matsui