Spectral characteristics of caries-related autofluorescence spectra and their use for diagnosis of caries stage
Spectral characteristics of caries-related autofluorescence spectra and their use for diagnosis of caries stage
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DOI：
10.1117/1.jbo.21.1.015001
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发表时间：
2016-01-01
影响因子：
3.5
通讯作者：
Kwon, Yong Hoon
中科院分区：
文献类型：
--
作者：
Son, Sung-Ae;Jung, Kyeong-Hoon;Kwon, Yong Hoon
本研究的目的是通过激光诱导自发荧光（AF）光谱确定有助于诊断龋齿阶段的因素。受影响的牙齿被准确地分期并分为四组：健全组、II 期、III 期或 IV 期。使用 405 nm 激光产生 AF 光谱。分析的光谱因素是550至600 nm处的光谱斜率、500至590 nm的光谱面积以及625和667 nm峰的强度比(625/667 nm)。 DIAGNOdent 用作对照测量。健全牙齿的 AF 光谱在 500 nm 附近有一个峰值，随后平滑下降到 800 nm。随着龋齿的进展，II 至 IV 期的一些标本在 625 和 667 nm 附近显示出一两个峰值。每个阶段的 550 至 600 nm 处的斜率和 500 至 590 nm 处的曲线下面积显着不同 (p < 0.001)。除 III 期和 IV 期外，双峰比率也显着不同 (p < 0.001)。声音和 II 期、III 期和 IV 期的诊断读数没有显着差异。在研究的因素中，550至600 nm的光谱斜率和500至590 nm的曲线下面积可能是龋齿病变的有用治疗决策工具。 (C) 2016 年光电仪器工程师协会 (SPIE)
The purpose of the present study was to identify factors useful for diagnosis of the caries stage from laser-induced autofluorescence (AF) spectra. Affected teeth were accurately staged and allocated to four groups: sound, stage II, stage III, or stage IV. A 405-nm laser was used to produce AF spectra. The spectrum factors analyzed were spectrum slope at 550 to 600 nm, spectral area from 500 and 590 nm, and intensity ratio of peaks 625 and 667 nm (625/667 nm). DIAGNOdent was used as control measurement. AF spectra of sound teeth had a peak near 500 nm followed by a smooth decline to 800 nm. As caries progressed, some specimens in stages II to IV showed one or two peak(s) near 625 and 667 nm. Slopes at 550 to 600 nm and areas under the curve at 500 to 590 nm were significantly different (p < 0.001) for each stage. Two-peak ratios were also significantly different (p < 0.001) except for stage III and stage IV. DIAGNOdent readings for sound and stage II and stage III and IV were not significantly different. Among the studied factors, the spectrum slope at 550 to 600 nm and area under curve at 500 to 590 nm could be useful treatment decision-making tools for carious lesions. (C) 2016 Society of Photo-Optical Instrumentation Engineers (SPIE)