An algorithm for precise aperture photometry of critically sampled images
An algorithm for precise aperture photometry of critically sampled images
复制标题
临界采样图像的精确孔径光度测量算法
DOI：
10.1093/mnras/stt244
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发表时间：
2013
影响因子：
4.8
通讯作者：
R. Lupton
中科院分区：
文献类型：
--
作者：
S. Bickerton;R. Lupton
我们提出了一种算法，用于执行严格采样天体物理图像的精密孔径测光。该方法旨在克服点采样所施加的小孔径限制。孔径通量在所需孔径上进行数值积分，使用正弦插值来重建像素中心之间的值。在孔径上的直接积分是计算密集型的，但是所讨论的积分被示出为卷积积分，并且作为波数域中的乘积可以更快地计算~ 10000倍。该方法同样适用于环形和椭圆形孔，并可适用于任何几何形状。提供了一个代码示例来演示该方法。
We present an algorithm for performing precise aperture photometry on critically sampled astrophysical images. The method is intended to overcome the small-aperture limitations imposed by point-sampling. Aperture fluxes are numerically integrated over the desired aperture, with sinc-interpolation used to reconstruct values between pixel centers. Direct integration over the aperture is computationally intensive, but the integrals in question are shown to be convolution integrals and can be computed ~10000x faster as products in the wave-number domain. The method works equally well for annular and elliptical apertures and could be adapted for any geometry. A sample of code is provided to demonstrate the method.