A Model for the Characterization of the Polarizability of Thin Films Independently of the Thickness of the Film.
A Model for the Characterization of the Polarizability of Thin Films Independently of the Thickness of the Film.
复制标题
独立于薄膜厚度的薄膜极化率表征模型。
DOI：
10.1021/acs.jpcb.7b06975
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发表时间：
2017
影响因子：
3.3
通讯作者：
Miquel Salmeron
中科院分区：
文献类型：
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作者：
G. Sacha;Albert Verdaguer;Miquel Salmeron
相对于体材料，薄膜的介电性能可以改变，因为薄膜和衬底之间的相互作用会影响第一层中原子或分子的迁移率。在这里，我们表明，一个强大的规模效应发生在纳米尺寸的十八胺薄膜。这种效应归因于取决于膜的尺寸的分子的不同分布。为了准确地描述这种效应，我们已经开发了一个模型，这是一个重新解释的线性化的费米子-费米近似。在这个模型中，我们已经能够独立于膜的厚度来表征薄膜的极化率。
The dielectric properties of thin films can be modified relative to the bulk material because the interaction between film and substrate influences the mobility of the atoms or molecules in the first layers. Here we show that a strong scale effect occurs in nanometer size octadecylammine thin films. This effect is attributed to the different distribution of molecules depending on the size of the film. To accurately describe this effect, we have developed a model which is a reinterpretation of the linearized Thomas-Fermi approximation. Within this model, we have been able to characterize the polarizability of thin films independently of the thickness of the film.