Spinning pupil aberration measurement for anisoplanatic deconvolution
Spinning pupil aberration measurement for anisoplanatic deconvolution
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DOI：
10.1364/ol.427518
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发表时间：
2021-06-15
期刊：
影响因子：
3.6
通讯作者：
Bassi, Andrea
中科院分区：
文献类型：
--
作者：
Ancora, Daniele;Furieri, Tommaso;Bassi, Andrea
光学显微镜中的像差通常是在视场中的一个位置测量和校正的，在所谓的等晕片内。对于大样本的高分辨率成像，全场校正是可取的。在这里，据我们所知，我们提出了一种新型的波前探测器，它基于用子孔径进行的光瞳采样，测量样品每个位置上的像差波前相位。基于这一测量结果，我们提出了一种区域反卷积方法，它提供了样本图像的各向异性重建。我们的结果表明，像差的测量和校正可以在广视场荧光显微镜的整个视场内进行。(C)2021年美国光学学会。
The aberrations in an optical microscope are commonly measured and corrected at one location in the field of view, within the so-called isoplanatic patch. Full-field correction is desirable for high-resolution imaging of large specimens. Here we present, to the best of our knowledge, a novel wave-front detector, based on pupil sampling with subapertures, measuring the aberrated wavefront phase at each position of the specimen. Based on this measurement, we propose a region-wise deconvolution that provides an anisoplanatic reconstruction of the sample image. Our results indicate that the measurement and correction of the aberrations can be performed in a wide-field fluorescence microscope over its entire field of view. (C) 2021 Optical Society of America.