Analysis of lateral force contribution to the topography in contact mode AFM
Analysis of lateral force contribution to the topography in contact mode AFM
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DOI：
10.1007/s003390051157
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发表时间：
1998-03
期刊：
影响因子：
--
通讯作者：
G. Shang;X. Qiu;Changtao Wang;C. Bai
中科院分区：
文献类型：
--
作者：
G. Shang;X. Qiu;Changtao Wang;C. Bai
抽象。我们采用一种简单的方法定量分析了接触式原子力显微镜与激光束偏转系统的法向力和侧向力。考虑到悬臂梁的行为和样品表面的性质，已经建立了所施加的力与表面的性质（局部斜率和局部摩擦系数）之间的关系。结果表明，横向力可以在悬臂梁偏转中发挥重要作用，并可能导致显着失真的地形图像。这一工作为接触式原子力显微镜的表面形貌分析提供了有益的参考。
Abstract. We employed a simple method to quantitatively analyze normal and lateral forces in contact mode AFM with the laser-beam deflection system. Taking into account the behavior of the cantilever and properties of the sample surface, the relationship between the applied forces and the properties (the local slope and local friction coefficient) of the surface have been established. It is shown that the lateral force could be playing an important role in cantilever deflection and could result in significant distortion of the topographic images. This work may benefit the analysis of the surface topography obtained by contact mode AFM.