Observation of strong magnetic anisotropy in zinc-blende CrTe thin films
Observation of strong magnetic anisotropy in zinc-blende CrTe thin films
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DOI：
10.1088/0022-3727/41/4/045002
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发表时间：
2008-02
期刊：
影响因子：
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通讯作者：
J. Bi;M. Sreenivasan;K. Teo;T. Liew
中科院分区：
文献类型：
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作者：
J. Bi;M. Sreenivasan;K. Teo;T. Liew
我们报告的生长锌掺杂CrTe薄膜的标称厚度为5 nm的低温分子束外延。反射高能电子衍射图案，原子力显微镜和高分辨率透射电子显微镜分析建立了准二维逐层生长模式实现。我们观察到在薄膜中的一个强的磁各向异性的易磁化轴沿着[0 0 1]方向。通过沿着[0 1 1]方向和磁化曲线的硬轴拟合，得到了单轴（KU）和立方（KC）各向异性常数。居里温度为100 K，从温度依赖的剩余磁化强度测量。
We report the growth of zinc-blende CrTe thin films with a nominal thickness of 5 nm by low-temperature molecular-beam epitaxy. Reflection high-energy electron diffraction patterns, atomic force microscopy and high-resolution transmission electron microscopy analyses established that a quasi-two-dimensional layer-by-layer growth mode is achieved. We observe a strong magnetic anisotropy in the film with an easy axis along the [0 0 1] direction. The uniaxial (KU) and cubic (KC) anisotropy constants are obtained through the fitting of the hard axes along the [0 1 1] and directions of the magnetization curves. A Curie temperature of 100 K is obtained from the temperature-dependent remanent-magnetization measurement.