Time-resolved soft x-ray absorption spectroscopy of silicon using femtosecond laser plasma x rays
Time-resolved soft x-ray absorption spectroscopy of silicon using femtosecond laser plasma x rays
复制标题
使用飞秒激光等离子体 X 射线对硅进行时间分辨软 X 射线吸收光谱
DOI：
10.1063/1.125011
复制
发表时间：
1999
影响因子：
4
通讯作者：
N. Uesugi
中科院分区：
文献类型：
--
作者：
H. Nakano;Y. Goto;P. Lu;T. Nishikawa;N. Uesugi
We measured time-resolved soft x-ray absorption of photoexcited silicon by means of pump-probe spectroscopy, using a picosecond soft x-ray pulse from femtosecond laser-produced plasma as a probe. We observed a 5% increase in the absorption caused by 1010 W/cm2 intensity laser pulse irradiation near the LII,III edge at 100 eV. The change was observed only when the laser and the soft x-ray pulses overlapped on the sample both in time and space.
