Controlled Growth of Unidirectionally Aligned Hexagonal Boron Nitride Domains on Single Crystal Ni (111)MgO Thin Films
Controlled Growth of Unidirectionally Aligned Hexagonal Boron Nitride Domains on Single Crystal Ni (111)MgO Thin Films
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单晶 Ni(111)MgO 薄膜上单向排列六方氮化硼畴的控制生长
DOI:
10.1021/acs.cgd.8b01542
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发表时间:
2019
影响因子:
3.8
通讯作者:
Wang Ruzhi
中科院分区:
文献类型:
--
作者:
Meng Junhua;Ming Bangming;Zhang Xingwang;Gao Menglei;Cheng Likun;Yin Zhigang;Wang Denggui;Li Xingxing;You Jingbi;Wang Ruzhi
Two-dimensional (2D) hexagonal boron nitride (h-BN) is considered as an ideal dielectric layer or substrate for other 2D heterostructure electronic devices. However, reported 2D h-BN films consist mostly of small sized and randomly oriented h-BN domains, resulting in a high density of grain boundaries during coalescence. Here, we report the growth of unidirectionally aligned h-BN domains in a large area on the Ni(111) epitaxial thin film on MgO(111) substrate by ion beam sputtering deposition. It is found that the in-plane orientation of the underlying Ni thin film, which can be controlled by its deposition temperature, plays a key role in the h-BN domain alignment. Furthermore, density functional theory calculations are performed to determine the favorable configuration of the triangular shaped h-BN domains on Ni(111). This work provides a promising approach to prepare unidirectionally aligned h-BN domains in a large area, and thus it is possible to achieve wafer-scale single crystal h-BN by stitching these h-BN domains.