Molecular cytogenetic characterization of wheat-Elymus repens chromosomal translocation lines with resistance to Fusarium head blight and stripe rust
Molecular cytogenetic characterization of wheat-Elymus repens chromosomal translocation lines with resistance to Fusarium head blight and stripe rust
复制标题
小麦-披碱草染色体易位系抗赤霉病和条锈病的分子细胞遗传学特征
DOI：
10.1186/s12870-019-2208-x
复制
发表时间：
2019-12-27
影响因子：
5.3
通讯作者：
Kang, Houyang
中科院分区：
文献类型：
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作者：
Gong, Biran;Zhu, Wei;Kang, Houyang
研究背景禾谷镰刀菌（Fusarium graminearum施瓦贝）引起的赤霉病和小麦条锈菌（Pucciniastriiformis f.小麦赤霉病是影响全世界小麦生产的毁灭性病害。使用抗病基因和品种是减少使用杀真菌剂防治这些疾病的最有效手段。白绒麦（2n=6x=42，StStStStHH）是一个潜在的小麦赤霉病和条锈病抗性改良种质。从普通小麦-E.匍匐茎杂种。K15-1192-2和K15-1194-2减数分裂时的平均染色体构型分别为2n=42=0.86 I+17.46 II（环）+3.11 II（杆）和2n=42=2.45 I+14.17 II（环）+5.50 II（杆）+0.07 III。基因组和荧光原位杂交核型分析和简单重复序列标记表明，K15-1192-2是一个小麦-E。repens 3D/？St双末端染色体易位系。线K15-1194-2被确定为窝藏一对7 DS/？StL罗伯逊易位和一个3D/？双端易位染色体。利用特异表达序列标签SSR标记进一步分析证实，小麦-E.在两个品系中，repens易位涉及3St染色质。K15-1192-2和K15-1194-2与亲本川农16相比，对赤霉病和条锈病表现出高水平的抗性。结果表明，这些易位系中含有高抗赤霉病和条锈病的基因，且3St的染色质在小麦染色体上完全表现出抗病性，表明这些易位系可作为小麦抗病育种和外源基因挖掘的新材料。
BackgroundFusarium head blight (FHB) caused by the fungus Fusarium graminearum Schwabe and stripe rust caused by Puccinia striiformis f. sp. tritici are devastating diseases that affect wheat production worldwide. The use of disease-resistant genes and cultivars is the most effective means of reducing fungicide applications to combat these diseases. Elymus repens (2n=6x=42, StStStStHH) is a potentially useful germplasm of FHB and stripe rust resistance for wheat improvement.ResultsHere, we report the development and characterization of two wheat-E. repens lines derived from the progeny of common wheat-E. repens hybrids. Cytological studies indicated that the mean chromosome configuration of K15-1192-2 and K15-1194-2 at meiosis were 2n=42=0.86 I+17.46 II (ring)+3.11 II (rod) and 2n=42=2.45 I+14.17 II (ring)+5.50 II (rod)+0.07 III, respectively. Genomic and fluorescence in situ hybridization karyotyping and simple sequence repeats markers revealed that K15-1192-2 was a wheat-E. repens 3D/?St double terminal chromosomal translocation line. Line K15-1194-2 was identified as harboring a pair of 7DS/?StL Robertsonian translocations and one 3D/?St double terminal translocational chromosome. Further analyses using specific expressed sequence tag-SSR markers confirmed that the wheat-E. repens translocations involved the 3St chromatin in both lines. Furthermore, compared with the wheat parent Chuannong16, K15-1192-2 and K15-1194-2 expressed high levels of resistance to FHB and stripe rust pathogens prevalent in China.ConclusionsThus, this study has determined that the chromosome 3St of E. repens harbors gene(s) highly resistant to FHB and stripe rust, and chromatin of 3St introgressed into wheat chromosomes completely presented the resistance, indicating the feasibility of using these translocation lines as novel material for breeding resistant wheat cultivars and alien gene mining.