Temporal speckle pattern interferometry for measuring micron-order surface motion of a liquid bridge
Temporal speckle pattern interferometry for measuring micron-order surface motion of a liquid bridge
复制标题
用于测量液桥微米级表面运动的时间散斑干涉仪
DOI：
10.1088/0957-0233/15/11/014
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发表时间：
2004
期刊：
影响因子：
--
通讯作者：
S. Yoda
中科院分区：
文献类型：
--
作者：
Xinbo Li;K. Nishino;S. Yoda
本文提出了一种基于电子散斑干涉术（ESPI）的新方法--时间散斑干涉术（TSPI）的准圆柱形液桥变形表面微米级运动测量技术。最近提出的时间序列相位法（TSPM）已被扩展到发展自动化和强大的程序的时间相位恢复散斑图。的程序的性能进行了验证，通过计算机模拟所涉及的参数范围。该技术被实现到TSPI系统中，利用毛玻璃从非散斑参考和对象波前产生散斑。用该方法测量了平面镜和圆柱玻璃棒的动态位移，并与激光聚焦位移计同时测量的结果进行了比较。从硅油液桥的动态表面位移获得的一些实验结果证明了本技术的能力。
This paper presents a technique based on temporal speckle pattern interferometry (TSPI), a new version of electronic speckle pattern interferometry (ESPI), for measuring micron-order motion of a deformable surface of a quasi-cylindrical liquid bridge. The time sequence phase method (TSPM) proposed recently has been extended to develop automated and robust procedures for temporal phase recovering of specklegrams. The performance of the procedures is verified through computer simulations made in a range of parameters involved. The technique is implemented into a TSPI system utilizing a ground glass for generating speckles from non-speckled reference and object wavefronts. The validity and accuracy of the technique are examined in the measurement of dynamic displacement of both a flat mirror and a cylindrical glass rod, where detailed comparison is made with the simultaneous measurement taken with the laser focusing displacement meter. The capability of the present technique is demonstrated by some experimental results obtained from dynamic surface displacement of a liquid bridge of silicone oil.