Resolution in collection-mode scanning optical microscopy
Resolution in collection-mode scanning optical microscopy
复制标题
采集模式扫描光学显微镜的分辨率
DOI：
10.1063/1.353319
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发表时间：
1993
期刊：
影响因子：
--
通讯作者：
M. Paesler
中科院分区：
文献类型：
--
作者：
E. Buckland;P. Moyer;M. Paesler
在扫描探针光学传感装置中使用小孔径或锐尖作为传感元件，导致了许多仪器的发展，这些仪器提供比传统光学成像仪器更精细的横向空间分辨率。这样的设备通常可以归类为扫描光学显微镜，或SOM。SOM操作的一种特殊模式包括使用锐化的光纤来收集从表面发出的光。根据探针尖端的电磁模式解，讨论了这种收集模式SOM的横向空间分辨率。数值结果表明，尽管对于越来越细的无包层尖端存在束缚模式解，但经典衍射效应将分辨率限制在源波长λ的有限分数（约1/3）。信号转导的第二种机制与探针尖端的分子散射有关。通过对信号采集效率的分析表明，在尖端位置的信号采集效率是高的。
The use of small apertures or sharpened tips as sensing elements in scanned‐probe optical sensing devices has led to the development of a number of instruments that provide lateral spatial resolution much finer than that available in conventional optical imaging instruments. Such a device might generally be classified as a scanning optical microscope, or SOM. One particular mode of SOM operation involves the use of a sharpened optical fiber to collect light emanating from a surface. The lateral spatial resolution of such a collection‐mode SOM is discussed in terms of the electromagnetic mode solutions of the probe tip. Numerical results indicate that, though bound modes solutions exist for increasingly fine unclad tips, classical diffraction effects limit resolution to a finite fraction (approximately 1/3) of the source wavelength λ. A second mechanism for signal transduction is shown to involve molecular scattering at the probe tip. An analysis of signal collection efficiency demonstrates that at tip rad...