Effective tip radius in electrostatic force microscopy
Effective tip radius in electrostatic force microscopy
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DOI：
10.1063/1.1884764
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发表时间：
2005-03
影响因子：
4
通讯作者：
G. Sacha;A. Verdaguer;J. Martı́nez;J. Sáenz;D. Ogletree;M. Salmeron
中科院分区：
文献类型：
--
作者：
G. Sacha;A. Verdaguer;J. Martı́nez;J. Sáenz;D. Ogletree;M. Salmeron
提出了一种确定原子力显微镜中任意形状导电针尖有效静电针尖半径的方法。该方法是基于这样的发现，即对于导电样品，静电力可以分为两个贡献：一个从一个恒定的背景，仅取决于宏观形状的尖端（圆锥体或金字塔和悬臂），另一个仅取决于尖端顶点的曲率半径。基于广义镜像电荷法推导出的简单理论表达式，我们表明可以根据实验力-距离特性直接确定尖端半径。对于不规则的尖端形状，我们表明，测得的尖端半径是两个主曲率的平均值，与通过扫描电子显微镜获得的尖端形状图像。
A method to determine the effective electrostatic tip radius of arbitrarily shaped conducting tips in atomic force microscopy is presented. The method is based on the finding that for conductive samples, the electrostatic force can be separated into two contributions: one from a constant background that depends only on the macroscopic shape of the tip (cone or pyramid and cantilever), and another that depends only on the radius of curvature of the tip apex. Based on a simple theoretical expression derived from the generalized image charge method, we show that the tip radius can be directly determined from experimental force-distance characteristics. For irregular tip shapes, we show that the measured tip radius is the average of two principal curvatures, in agreement with tip shape images obtained by scanning electron microscopy.