Formation of hollow ZnO through low-temperature oxidation of Zn nanoparticles
Formation of hollow ZnO through low-temperature oxidation of Zn nanoparticles
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DOI：
10.1016/j.matlet.2006.06.039
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发表时间：
2007-02
影响因子：
3
通讯作者：
R. Nakamura;J. Lee;D. Tokozakura;H. Mori;H. Nakajima
中科院分区：
文献类型：
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作者：
R. Nakamura;J. Lee;D. Tokozakura;H. Mori;H. Nakajima
用透射电镜研究了Zn纳米粒子氧化过程中的空心现象。在423 K下氧化直径小于20 nm的Zn纳米粒子3.6 ks，得到空心ZnO。ZnO中心的纳米孔可以看作是一个空位簇，它是在空气中氧化初期，由于Zn在ZnO中的扩散速度加快，空位产生并聚集而形成的。
The hollow phenomenon with the oxidation of Zn nanoparticles was studied by transmission electron microscopy. Hollow ZnO was formed by oxidizing Zn nanoparticles with the diameter less than 20 nm at 423 K for 3.6 ks. Nano-hole in the center of ZnO can be considered as a vacancy cluster, which is formed as the result of the generation and aggregation of vacancies due to faster outward diffusion of Zn across ZnO in air at the initial oxidation stage.