Identifying defects in an unknown background usingdifferential measurements

Identifying defects in an unknown background usingdifferential measurements
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使用差分测量识别未知背景中的缺陷

DOI：
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发表时间：
2015
期刊：
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通讯作者：
H. Haddar
H. Haddar
中科院分区：
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文献类型：
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作者：
Lorenzo Audibert;Girard Alexandre;H. Haddar

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我们提出了一种新的定性成像方法，能够选择缺陷， 来自远场差分测量的复杂和未知背景 运营商：即在具有和 没有缺陷。实际上，主要的困难在于背景物理 属性未知。我们的方法是基于一个新的精确表征 的散射域的远场算子范围和链接 解决所谓的内部传输问题。我们目前的 该方法的理论基础和一些验证性的数值实验 在二维环境中。
We present a new qualitative imaging method capable of selecting defects in complex and unknown background from differential measurements of farfield operators: i.e. far measurements of scattered waves in the cases with and without defects. Indeed, the main difficulty is that the background physical properties are unknown. Our approach is based on a new exact characterization of a scatterer domain in terms of the far field operator range and the link with solutions to so-called interior transmission problems. We present the theoretical foundations of the method and some validating numerical experiments in a two dimensional setting.