Real Time Synchrotron X-Ray Imaging for Nucleation and Growth of Cu6Sn5 in Sn-7Cu-0.05Ni High Temperature Lead-Free Solder Alloys
Real Time Synchrotron X-Ray Imaging for Nucleation and Growth of Cu6Sn5 in Sn-7Cu-0.05Ni High Temperature Lead-Free Solder Alloys
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DOI:
10.4028/www.scientific.net/amr.626.200
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发表时间:
2012-12
期刊:
影响因子:
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通讯作者:
K. Nogita;H. Yasuda;S. McDonald;K. Uesugi
中科院分区:
文献类型:
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作者:
K. Nogita;H. Yasuda;S. McDonald;K. Uesugi
This paper demonstrates how recent progress for real-time solidification observation at SPring-8 synchrotron has contributed to the development of Sn-7wt%Cu-0.05wt%Ni high temperature lead-free solder alloys. Lead-free solder alloys in the composition range Sn-0.7 to 7.6wt%Cu that consist of primary Cu6Sn5 in a eutectic Sn-Cu6Sn5 matrix have been proposed as solders for application at temperatures up to 400°C for the assembly high current semiconductors. It is shown that trace levels of Al have a marked effect on the solder microstructure and refine the size of the primary Cu6Sn5. The solidification pathway that leads to the refinement was observed in real-time using X-ray synchrotron observations.