Variable Pressure Scanning Electron Microscopy (VPSEM)
Variable Pressure Scanning Electron Microscopy (VPSEM)
复制标题
变压扫描电子显微镜 (VPSEM)
DOI:
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发表时间:
2018
期刊:
影响因子:
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通讯作者:
D. Joy
中科院分区:
文献类型:
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作者:
J. Goldstein;D. Newbury;J. Michael;N. Ritchie;J. H. Scott;D. Joy
The conventional SEM must operate with a pressure in the sample chamber below ~10−4 Pa (~10−6 torr), a condition determined by the need to satisfy four key instrumental operating conditions: