Do SnI4 molecules deform on heating and pressurization in the low-pressure crystalline phase?
Do SnI4 molecules deform on heating and pressurization in the low-pressure crystalline phase?
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SnI4 分子在低压结晶相中加热和加压时会变形吗?
DOI:
10.1088/1361-648x/ab4cbc
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发表时间:
2019
期刊:
影响因子:
--
通讯作者:
Saitoh Hiroyuki
中科院分区:
文献类型:
--
作者:
Naruta Hiroki;Fuchizaki Kazuhiro;Wakabayashi Daisuke;Suzuki Akio;Ohmura Ayako;Saitoh Hiroyuki
A SnI 4 molecule lowers its symmetry from T d to on the liquid–liquid transition. Because it is possible to lower the molecular symmetry without violating the crystalline symmetry, it is worth examining whether the deformation occurs in the crystalline phase field. Extended x-ray absorption fine structure (EXAFS) measurements on the crystalline state were carried out to investigate the change in the environment around a Sn atom at high pressures and temperatures. We could not find clear evidence on the symmetry change of molecules even close to the melting points, where the melting curve becomes abnormally flat against pressure. Indeed, no inconsistency was found when we assumed that the coordination number of a Sn atom remains unchanged in the temperature and pressure range examined. The situation remains true when the system entered the high-pressure crystalline phase on compression. We can propose a consistent scenario as to the structural change on the phase transformation. The incompressibility of a SnI 4 molecule could be suitably quantified. The procedure enabled us to conclude the molecule is more than an order of magnitude incompressible than the lattice.
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DOI:
10.1088/0022-3719/10/10/019
发表时间:
1977
期刊:
Journal of Physics C: Solid State Physics
影响因子:
--
作者:
I. Heilmann;N. B. Olsen
通讯作者:
N. B. Olsen
影响因子:
3.7
作者:
PARSAFAR, G;MASON, EA
通讯作者:
MASON, EA
影响因子:
3.7
作者:
Wakabayashi Daisuke;Funamori Nobumasa;Kikegawa Takumi;Watanabe Kazuki;Kohara Shinji;Nitani Hiroaki;Niwa Yasuhiro;Takeichi Yasuo;Abe Hitoshi;Kimura Masao
通讯作者:
Kimura Masao
影响因子:
1.7
作者:
K. Fuchizaki;N. Hamaya
通讯作者:
N. Hamaya
影响因子:
4.4
作者:
K. Fuchizaki;S. Sugiyama;Y. Fujii
通讯作者:
Y. Fujii