Structural characterisation of Cu2.04Zn0.91Sn1.05S2.08Se1.92
Structural characterisation of Cu2.04Zn0.91Sn1.05S2.08Se1.92
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Cu2.04Zn0.91Sn1.05S2.08Se1.92的结构表征
DOI:
10.1002/pssc.201400307
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发表时间:
2015
期刊:
影响因子:
--
通讯作者:
S. Schorr
中科院分区:
文献类型:
--
作者:
G. Gurieva;M. Dimitrievska;S. Zander;A. Pérez‐Rodríguez;V. Izquierdo‐Roca;S. Schorr
Quaternary Cu2ZnSn(S1-xSex)4 compounds are promising semiconductor materials for absorber layer in thin film solar cells. Record efficiency devices (12.6%) exhibit an off-stoichiometric composition of the absorber layer. These deviations from stoichiometry cause intrinsic point defects, which determine the electronic properties of the semiconductor significantly. A structural analysis of a nearly C-type off-stoichiometric Cu and Sn rich and Zn poor Cu2ZnSn(S1-xSex)4 mixed crystal with x=0.48 by a neutron diffraction investigation was performed. The average neutron scattering length method was applied, showing that the mixed crystal adopts the kesterite type structure. A detailed cation distribution analysis revealed the occurrence of ZnCu(2a) and SnZn anti-site point defects additional to the Cu-Zn disorder in the planes at z=1/4 and 3/4. (© 2015 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim)