Resonant tender X-ray scattering of organic semiconductors

该项目旨在建立共振温柔X射线散射作为一种成熟的技术，用于解开有机半导体层的复杂微观结构。通过理解和利用有机半导体和调谐到适当吸收边的X射线之间的共振相互作用，将获得关于这些材料的分子堆积的新信息。预期成果是确定技术相关材料复杂结构的新实验方法和分析工具。优势包括了解溶液处理半导体的特性，从而能够设计出高性能材料，应用于能源，电子，照明和健康。

This project aims to establish resonant tender X-ray scattering as a mature technique for unravelling the complex microstructure of organic semiconductor layers. By understanding and exploiting the resonant interaction between organic semiconductors and X-rays tuned to appropriate absorption edges, new information about the molecular packing of these materials will be obtained. The expected outcomes are new experimental methodologies and analysis tools for determining the complex structure of technologically relevant materials. Benefits include understanding of the properties of solution-processed semiconductors enabling the design of high performance materials with applications in energy, electronics, lighting and health.