Acquisition of High Resolution X-Ray Diffractometer for Materials Research

摘要 大卫T.放大图片作者：Louis J. Guido，加里L.耶鲁大学 标题：采购用于材料研究的高分辨率X射线衍射仪 耶鲁大学的机械和电气工程系将购买飞利浦X'PERT材料研究衍射仪系统，该系统具有广泛的选择范围。超过47%的费用分摊由大学提供。主要用途将是在材料科学项目，包括半导体薄膜的合成，金属塑性材料长度尺度和晶粒生长动力学。该设备还将用于加强材料科学的教学。

ABSTRACT CTS-9871338 David T. Wu, Louis J. Guido, Gary L. Povirk Yale University Title: Acquisition of High Resolution X-Ray Diffractometer for Materials Research The departments of Mechanical and Electrical Engineering at Yale University will purchase a Philips X'PERT Materials Research Diffractometer system with a wide range of options. Cost-sharing of over 47% is provided by the university. The primary uses will be in materials science projects, including Synthesis of Semiconductor Thin Films, Material Length Scales in Metal Plasticity, and Dynamics of Grain Growth. The equipment will be used also to enhance the teaching of materials science.