Acquisition of a Scanning Electron Microscope with Electron Backscatter Diffraction Capability for Research and Education

9975805 king该奖项将为石溪大学材料科学与工程系材料表征实验室的一台新型扫描电子显微镜提供部分支持。该仪器将为电子背散射模式分析领域提供新的能力，促进薄膜和大块材料中三重结的广泛研究，以及材料的纹理和其他相关效应的研究。该仪器还将用于开发和应用新技术，以观察导电基材上绝缘涂层的次表面裂纹。广泛的其他材料研究项目将通过此次收购得到加强：14名石溪大学教师将构成该仪器的主要用户群。广泛的教育项目也将通过新仪器得到加强。该显微镜将为石溪校区和长岛地区的普通用户提供显著改善的服务，并丰富学生的教育经验。

9975805KingThis award will provide partial support for a new scanning electron microscope to be housed in the Materials Characterization Laboratory of Stony Brook's Department of Materials Science and Engineering. The instrument will provide new capabilities in the area of electron backscatter pattern analysis, facilitating a broad range of studies of triple junctions in thin films and bulk materials, in addition to studies of texture and other related effects in materials. The instrument is also to be used to develop and apply novel techniques for the observation of sub-surface cracks in insulating coatings on conductive substrates.A wide range of other materials research projects will be enhanced by this acquisition: 14 Stony Brook faculty members will constitute the primary user-base of the instrument. A wide range of educational programs will also be enhanced by the new instrument.%%%The microscope will provide significantly improved service to general users from the Stony Brook campus and the Long Island region, and enrich the educational experience of students.