Acquisition of Nanoindentation Testing System for Multi-Disciplinary Research at MTU

9977462 Miskioglug这是核磁共振计划支持的一项设备赠款。将获得的仪器是Nano Indenter XP及其相关附件，它们能够使非常小体积的材料变形，以表征材料的机械性能。该仪器可以测量极薄的薄膜和涂层、多相或复合材料中的单个相以及其他不适合常规测试的材料的性能。在动态纳米压痕选项中，将连续硬度测量(CMS)技术与动态接触模块(DCM)相结合，系统可以提供所有深度的接触硬度的直接和准确测量。因此，可以连续地确定材料属性。侧向力测量(LFM)选项提供了一种有效的工具来表征块状材料和涂层的耐刮擦性，以及薄膜的附着力和失效模式。该仪器将用于与材料微结构表征相关的研究。这些研究活动涉及具有细纤维和/或小颗粒的轻质复合材料、薄膜、多相聚合体系、硅片的表面机械性能和直写介观结构。在所有这些活动中，纳米压痕系统有望对这些材料的行为产生重要的洞察。

9977462MiskiogluThis is an equipment grant supported under the MRI Program. The instruments to be acquired are Nano Indenter XP and its related accessories which are able to deform very small volumes of material to characterize a material's mechanical properties. This instrument can measure the properties of extremely thin films and coatings, individual phases within a multi phase or composite material as well as other materials not well suited for conventional testing. In the dynamic nanoindentation option which uses the Continuous Stiffness Measurement (CMS) technique in conjunction with the Dynamic Contact Module (DCM), the system can provide a direct and accurate measurement of the contact stiffness at all depths. Material properties may thus be determined continuously. The Lateral Force Measurement (LFM) option provides an effective tool in characterizing scratch resistance in bulk materials and coatings, and adhesion and ode of failure in thin films. The instrument will be utilized in research related to micro-structural characterization of materials. These research activities address issues dealing with light weight composites with fine fibers and/or small particles, thin films, multi-phase polymeric systems, surface mechanical properties of silicon wafers and direct-write mesoscopic structures. In all these activities the nanoindentation system is expected to yield significant insight into the behavior of these materials.***