Improving a Microscopy Course: Integrating Electron Microscopy with Scanning Probe Microscopy

物理学（13）扫描探针显微镜（SPM）以其在原子和分子水平上的可视化和操作能力，已成为过去十年中科学和技术最重要的进步之一。这个项目是适应和整合SPM到一个两学期的电子显微镜（EM）课程，已在密苏里大学堪萨斯城（UMKC）教授。SPM仪器的加入给学生提供了更广泛的视野和经验的切割边缘显微镜技术。整合也允许一个更有效的方法讲授的主题，因为该课程涵盖了更广泛的技术inmicroscopy和强调这些技术在各个领域的应用。本课程的改进是通过引入，除了现有的手在EM上的实验，两个验证型实验使用SPM可视化明确的晶体表面上的原子结构在第一学期。这是其次，在第二学期，由三个探究为基础的实验，涉及两个SPM和EM。改进后的课程加强了UMKC在科学、数学、工程和技术方面的跨学科教育。

Physics (13) With its capability of visualization and manipulation at atomic and molecularlevels, scanning probe microscopy (SPM) has become one of the most importantadvancements in science and technology in the past decade. This project is adapting and integratingSPM into a two-semester Electron Microscopy (EM) course that has been taught at theUniversity of Missouri-Kansas City (UMKC). The addition of SPM instrumentation tothe course gives students a broader view and experience on the cutting edgemicroscopy technologies. The integration also allows a more efficient approach inteaching the subject, because the course covers a wider range of techniques used inmicroscopy and emphasizes the application of these techniques in various fields. Theimprovement of the course is being achieved by introducing, in addition to the existinghands-on experiments on EM, two verification-type experiments using SPM to visualizeatomic structures on well-defined crystalline surfaces in the first semester. This isfollowed, in the second semester, by three inquiry-based experiments that involve bothSPM and EM. The improved course enhances the interdisciplinary educationin science, mathematics, engineering and technology at UMKC.