MRI: Acquisition of 1/f Noise Measurement Instrumentation

在过去的二十年里，电噪声受到了广泛的关注，因为它被用来衡量半导体材料、器件和半导体激光器的质量。它在通信和仪器仪表中使用的半导体器件和激光器的应用中产生了许多问题。随着与软件相关的技术的改进，目前的挑战是精确测量1/f噪声的能力。1/f噪声采集仪器将有助于建立一个完整和广泛的研究，这将大大阐明固体、半导体材料和激光器中1/f噪声的原因和可能的减少。研究结果将用于确定半导体和金属薄膜的温度依赖性、性质和性能。这项研究更广泛的影响包括培养少数民族本科生在学年和夏季开展具有挑战性的噪音研究项目。学年部分将侧重于通过噪声测量实验室的新教育技术加强学生的理工科背景，而夏季研究活动将旨在加强理工科专业学生的准备和研究技能。

Electrical 1/f noise has received much attention in the last twenty years because it is used as a measure of the quality of semiconductor materials, devices and semiconductor lasers. It creates especially many problems in the applications of semiconductor devices and lasers used in communication and in instrumentation. With improved technology associated with software, the present challenge is the ability to measure the 1/f noise with precision. The 1/f noise acquisition instrumentation will help to set up a complete and an extensive research which will shed considerable light on the causes and possible reduction of 1/f noise in solids, semiconductor materials and lasers. The results will be used to determine the temperature dependence, properties and performance of semiconductors and metal films. The broader impacts of the research include the training of undergraduate minority students for carrying out challenging noise research projects during the academic year as well as the summer. The academic year component will focus on strengthening the student's science and engineering background through new educational technology in the noise measurement laboratory while the summer research activities will be designed to strengthen the preparation and research skills of students majoring in science and engineering disciplines.