MRI: Acquisition of a scanning X-ray Photoelectron Spectrometer with Ultraviolet Photon Source and C60 Ion Gun

技术概述：x射线和紫外光电子能谱（分别为XPS和UPS）提供了表面和界面的化学成分，化学状态和电子特性的信息，这对于帮助理解和进一步开发广泛应用的材料至关重要。UPS功能与C60离子溅射源相结合，进一步将仪器功能扩展到“软材料”，如有机、聚合物和生物材料，这些材料在近几十年来受到了极大的科学关注。目前由美国国家科学基金会资助的佛罗里达大学项目将从该仪器中受益匪浅的例子包括：(1)表征用于电子和光电子应用的有机半导体和接口；(2)金属膦酸盐和氰金属酸盐材料的表面和界面；(3)纳米电子学纳米结构定向生长的分子方法；(4)先进镁合金微结构设计方法；(5)石墨烯等碳基材料及界面；(6)用于磁/生物传感的自组装胶体纳米颗粒。主要分析仪器中心（MAIC）是一个用户设施，为大学和周围社区的所有学科提供分析显微镜和光谱仪器支持。本提案中要求的最先进的XPS/UPS仪器取代了已有25年历史的XPS系统，该系统不仅通过大大提高效率加速了各种研究项目的进展，而且还通过空间成像、高分辨率化学分析和材料领域的广泛扩展提供了新的信息。这种仪器的广泛影响也通过佛罗里达大学和其他地方的一些教育和推广活动得以实现。非技术总结：许多现代技术的进步，如各种能源解决方案（存储、转换和保护）、纳米技术、电子和光子学、生物材料和生物技术以及运输，都依赖于对相关材料表面和/或不同材料组分之间界面的基本理解。最具信息量的表面分析技术之一是x射线或紫外线光电子能谱（分别为XPS和UPS），其中x射线或紫外线照射在目标材料上，通过分析从材料表面射出的电子的能量来揭示材料表面附近的原子类型和这些原子的局部化学环境和物理性质。当XPS/UPS与适当的材料沉积或去除技术相结合时，也可以探测埋藏的材料界面。该提案中要求的最先进的XPS/UPS仪器取代了主要分析仪器中心（MAIC）已有25年历史的XPS系统，该中心是佛罗里达大学的一个用户设施，拥有一系列用于研究各种材料的分析仪器。新仪器大大提高了效率，通过空间成像提供了新的信息，更高的能量分辨率，并极大地扩展了要表征的材料领域。此外，新仪器为许多研究生和本科生的跨学科研究培训和教育提供了独特的机会，也为K-12学生和教师以及一般科学和工程社区提供了机会。

Technical Summary:X-ray and ultraviolet photoelectron spectroscopies (XPS and UPS, respectively) provide information on chemical composition, chemical states, and electronic properties of surfaces and interfaces, which are critical to assist the understanding and further development of materials for a broad range of applications. The UPS capability coupled with the C60 ion sputtering source further expands the instrumentation capability to 'soft materials' such as organic, polymeric, and biological materials, which have received great scientific interests in recent decades. Examples of current NSF sponsored projects at the University of Florida that will greatly benefit from this instrument include: (1) characterization of organic-based semiconductors and interfaces for electronic and optoelectronic applications; (2) surfaces and interfaces of metal phosphonate and cyanometallate materials; (3) molecular approaches to directional growth of nanostructures for nanoelectronics; (4) microstructure-informed design methodology for advanced magnesium alloys; (5) graphene and other carbon-based materials and interfaces; (6) self-assembled colloidal nanoparticles for magnetic/biosensing applications. The Major Analytical Instrumentation Center (MAIC) is a user facility providing analytical microscopy and spectrometry instrumentation support to all disciplines at the university and the surrounding community. The state-of-the-art XPS/UPS instrument requested in this proposal replaces a 25-year-old XPS system, which not only accelerates the progress in various research programs through the vastly increased efficiency, but also provides new information through spatial imaging, high resolution chemical profiling, and vast expansion of the realm of materials to be characterized. The broader impacts of this instrumentation are also realized through a number of educational and outreach activities at the University of Florida and beyond.Non-Technical Summary: The advancement of many modern technologies, such as various energy solutions (storage, conversion, and conservation), nanotechnology, electronics and photonics, biomaterials and biotechnology, and transportation, rests upon the fundamental understanding of surfaces of the relevant materials and/or interfaces between different material components. One of the most informative surface analytical techniques is the x-ray or ultraviolet photoelectron spectroscopy (XPS and UPS, respectively), in which an x-ray or ultraviolet light is shone on the targeted materials and the types of atoms and the local chemical environment and physical properties of these atoms in the material near the surface are revealed by analyzing the energy of electrons ejected from the material surface. Buried material interfaces can also be probed when combining XPS/UPS with appropriate material deposition or removal techniques. The state-of-the-art XPS/UPS instrument requested in this proposal replaces a 25-year-old XPS system at the Major Analytical Instrumentation Center (MAIC), a user facility at the University of Florida which hosts an array of analytical instrumentation for the study of various types of materials. The new instrument provides vastly increased efficiency, new information through spatial imaging, higher energy resolution, and vast expansion of the realm of materials to be characterized. Furthermore, the new instrument provides unique opportunities for the cross-disciplinary research training and education of many graduate and undergraduate students, as well as opportunities for outreach to K-12 students and teachers and the general science and engineering community.