Student Support for Topical Conference on Cathodoluminescence 2011

该奖项将部分支持定于2011年10月24日至27日在马里兰州盖瑟斯堡国家标准与技术研究所（NIST）举行的阴极发光会议，该会议由微分析学会（MAS）和澳大利亚微束分析学会（AMAS）赞助。会议由NIST、澳大利亚联邦科学与工业研究组织（CSIRO）和澳大利亚新南威尔士大学的工作人员支持和组织。阴极发光（CL）是由电子束激发的发光材料发出的非白炽光（光子）。在电子显微镜中实施的CL是一种先进的微量分析技术，能够在广泛的材料中实现痕量元素和缺陷微观结构的高灵敏度、高空间分辨率表征。这些微结构缺陷强烈地影响技术上重要的纳米级和块状材料（包括陶瓷、陶瓷、半导体和光电器件材料等）的光学、电学和机械性质。矿物中微结构缺陷的CL分析在地球科学中也特别重要，例如，提供关于矿物化学、晶体生长、形成条件、蚀变、2011年10月在NIST举行的会议将是第一次关于阴极发光显微分析的会议，激发了国家和国际的兴趣和参与。会议遵循经证明成功的MAS专题会议形式，其中包括动手实验室演示，除了邀请和贡献的会议演示。实验室演示将在NIST表面和微分析科学部的高级测量实验室进行，参与者可以使用一系列最先进的CL系统，CL分析软件和支持仪器。此外，在专题会议期间，将安装NIST实验室中没有的其他CL系统和辅助设备。海报会议将是本次会议的一个亮点，允许额外的参与，特别是学生，博士后研究员和其他早期职业研究人员。优秀的NIST场地将为最多80名与会者（包括专业人士，供应商/赞助商和学生）提供参加CL专题会议的机会。

This award will partially support a conference focused on cathodoluminescence that is scheduled for October 24 - 27, 2011, at the National Institute of Standards and Technology (NIST) Gaithersburg, MD, under the sponsorship of the MicroAnalysis Society (MAS) and the Australian Microbeam Analysis Society (AMAS). The conference is supported and organized by staff of NIST, the Commonwealth Scientific and Industrial Research Organisation (CSIRO), Australia and the University of NSW, Australia.Cathodoluminescence (CL) is the non-incandescent emission of light (photons) emitted from a luminescent material excited by an electron beam. CL implemented in an electron microscope is an advanced microanalysis technique that enables high sensitivity, high spatial resolution characterization of trace elements and defect microstructure within a wide range of materials. These microstructural defects strongly influence the optical, electrical and mechanical properties of technologically important nanoscale and bulk materials including ceramics, dielectrics, semiconductor and optoelectronic device materials, etc. CL analysis of microstructural defects in minerals is also of particular importance in the geosciences providing for example, unique high sensitivity information about mineral chemistry, crystal growth, formation conditions, alteration, diagenesis, context for geochronological measurements, and provenance information of oil and mineral deposits.The meeting in October 2011 at NIST will be first meeting of its kind on cathodoluminescence microanalysis and has stimulated national and international interest and participation. The meeting follows the proven successful MAS Topical Conference format that includes hands-on laboratory demonstrations, in addition to invited and contributed conference presentations. The laboratory demonstrations will take place in the Advanced Measurement Laboratory of NIST's Surface and Microanalysis Science Division where a range of state-of-the-art CL systems, CL analysis software and supporting instrumentation are available to participants. In addition, other CL systems and ancillary equipment not represented in the NIST laboratories will be installed for the duration of the topical conference. Poster sessions will be a highlight of this conference, allowing additional involvement, particularly by students, post-doctoral fellows, and other early career researchers. The excellent NIST venue will provide the opportunity for a maximum of 80 participants (including professionals, vendors/ sponsors and students) to attend the topical conference on CL.