STTR Phase I: Smart and Fast Atomic Force Microscope for Imaging and Characterization

这个小型企业技术转移第一阶段项目代表了原子力显微镜（AFM）技术的概念和技术范式的变化，因此将对工业界和学术界的研究和发展产生重大影响。正如下面的技术优点所讨论的那样，所提出的AFM在成像和探测局部力学方面快速、智能和更强大。该公司拥有商业化AFM控制器的记录，该控制器与大多数类型的扫描仪兼容，包括商用和家用扫描仪。目前的AFM用户可以购买新的扫描仪和/或控制器来获得增强的性能。此外，新的AFM用户也被期待，特别是在纳米材料，设备和传感器，以及高空间和时间分辨率至关重要的多维设备和材料领域。此外，高空间分辨率与高速度的结合将在材料开发、表面涂层、纳米材料和纳米器件检测和质量控制、纳米光刻和组织工程等领域带来立竿见影的进展。根据目前的市场趋势，预计前三年内销售额将达到2500万美元。考虑到全球显微镜市场的预测增长，这个数字可能会更高。该项目的智力优势包括对当前AFM的三个前沿改进：(1)更快的图像采集速度；(2)自动快速特征查找和跟踪；(3)纳米机械成像的速度和效率提高1-2个数量级。超高速将通过在独特的混合低噪声控制器架构中实现针对AFM优化的新型可重构处理器来实现，该架构具有高度通用性，并且与来自许多不同供应商的AFM显微镜的各种已知配置兼容。此外，自动特征查找和跟踪功能将直接在硬件中使用人工智能和一种全新的扫描模式来完成，完全不同于目前的“追踪-重新追踪”。当前AFM的扫描轨迹。这些又新又聪明？方法进一步加快了扫描和跟踪速度。最后，AFM将能够使用多频光谱以高速和精确的方式产生纳米力学图像。这个概念已经被提出，并且在过去的五年或更长时间里，通过模拟或实验室原型，已经单独证明了各个方面。更快和更强大的电子控制器将使多频光谱技术的测试和实施发挥其全部潜力。

This Small Business Technology Transfer Phase I project represents a change in concept and technical paradigm for Atomic Force Microscopy (AFM) technology, and as such shall significantly impact research and development in both industry and academia. As discussed in the Technical Merits below, the proposed AFM is fast, smart, and more powerful in terms of imaging and probing local mechanics. The company has a track record of commercializing AFM controllers that are compatible with most all types of scanners, commercial and home-constructed. Current AFM users can purchase the new scanner and/or controller to attain the enhanced performance. In addition, new AFM users are also anticipated especially in the areas of nanomaterials, devices and sensors, and multidimensional devices and materials where both high spatial and temporal resolutions are paramount. Further, the combined high spatial resolution in conjunction with fast speed shall result in immediate advances in the fields of material development, surface coating, nanomaterial and nanodevice inspection and quality control, nanolithography, and tissue engineering. Based on current market trends, sales are anticipated to reach $25M within the first three years. The amount is likely higher given the forecasted growth of the global microscopy market. The intellectual merit of this project includes three cutting edge improvements to current AFM: (1) faster image acquisition speed; (2) automated and rapid feature finding and tracking; (3) 1-2 orders of magnitude of improvement in speed and efficiency in nanomechanical imaging. The ultra-high speed will be achieved by implementing a novel reconfigurable processor optimized for AFM into a unique hybrid, low-noise controller architecture, which is highly versatile and compatible with various known configurations of AFM microscopes from many different vendors. In addition, the automatic feature finding and tracking functions will be accomplished using artificial intelligence directly in hardware and a novel scan pattern, completely different from current ?trace-retrace? scanning trajectory in current AFM. These new and ?smart? approaches further speed up scanning and tracking speed. Finally, the AFM will be able to produce nanomechanical images with high speed and accuracy using multifrequency spectroscopy. This concept has been proposed, and individual aspects have been demonstrated in isolation through simulations or lab prototypes over the past five years or more. The faster and more powerful electronic controller shall enable the test and implementation of multifrequency spectroscopy technology in its full potential.