Towards Atomic Resolution Transmission Electron Microscopy Imaging of Electron-Beam-Sensitive Organic 2D Materials (B03)

该项目将以近原子甚至原子分辨率的有机二维DMS(2DPs，2D MOF，2D COF)的像差校正高分辨率透射电子显微镜(AC-HRTEM)成像为目标。通过对加速电压和样品制备技术的系统优化，将实现近原子/原子分辨率。在理论模型的帮助下，将阐明缺陷、晶界、表面重构以及缺陷-性质关联的形成机制。依赖于时间的非原位和原位观察将为深入了解有机2DMS的结晶和生长机制提供帮助。

This project will target at aberration-corrected high-resolution transmission electron microscopy (AC-HRTEM) imaging of organic 2DMs (2DPs, 2D MOFs, 2D COFs) with near-atomic or even atomic resolution. Near-atomic/atomic resolution will be achieved by a systematic optimization of the acceleration voltage and sample preparation techniques. With the assistance of theoretical modelling, the formation mechanisms of defects, grain boundaries, surface reconstructions, as well as defect-property correlations will be elucidated. Time-dependent ex-situ and in-situ observation will provide insights into the crystallization and growth mechanisms of organic 2DMs.