Development of Scanning Thermal Microscope with Microscale Quantitative Temperature Measurement Function.
Development of Scanning Thermal Microscope with Microscale Quantitative Temperature Measurement Function.
批准号:
13555051
负责人:
NAKABEPPU Osamu
金额:
$4.74万
依托单位国家:
日本
项目类别:
Grant-in-Aid for Scientific Research (B)
财政年份:
2001
资助国家:
日本
项目状态:
已结题
起止时间:
2001 至 2002
中文摘要
扫描热显微镜(SThM)通过温度敏感悬臂梁探针提供拓扑和热图像。通常,SThM通过检测样品上的接触点的热信息并将其转换为校准曲线来被动地测量温度或热特性。然而,被动的方法不能采取定量的温度图像,因为测量值受到各种因素,如表面温度,热性能,样品表面的不均匀性,吸附层,等等。因此,我们已经开发了一种新的主动方法,定量的温度成像,而不管在接触点的热导率的变化。在主动式方法中,热反馈控制步骤通过检测沿着悬臂梁的热流并将与之成比例的功率馈送到悬臂梁上,使悬臂梁保持与样品表面相同的温度,然后由悬臂梁上的另一传感器测量悬臂梁的温度。电加热器、温度传感器和反馈电路。主动系统在真实的温度测量中表现出良好的性能,而不考虑热
英文摘要
Scanning Thermal Microscope (SThM) provides topological and thermal images by a temperature sensing cantilever probe. Usually, the SThM passively measures temperature or thermal properties by detecting thermal information through a contact point on a sample and converting it with a calibration curve. However, the passive method can't take quantitative temperature image because measured values are influenced by various factors such as surface temperature, thermal properties, unevenness of sample surface, adsorption layer, and so on. Therefore, we have developed a novel active method for quantitative temperature imaging regardless of variations in thermal conductance at the contact point. In the active method, a thermal feedback control step maintains the cantilever at the same temperature as the sample surface by detecting heat flow along the cantilever and feeding power proportional to it to the cantilever, then cantilever temperature is measured by another sensor on it. We experimentally examined the active method by producing multi-function cantilevers with a heat flow sensor, electric heater and a temperature sensor and a feedback circuit. The active system demonstrated good performance in real temperature measurement regardless of thermal
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Osamu Nakabeppu, Takamitsu Suzuki: "Development of Scanning Thermal Microscopy for Nano-scale Real Temperaure Measurement"Heat Transfer 2002,Proceedings of the Twelfth International Heat Transfer Conference. 1. 447-452 (2002)
Osamu Nakabeppu、Takamitsu Suzuki:“用于纳米级真实温度测量的扫描热显微镜的发展”传热 2002,第十二届国际传热会议论文集。
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Osamu Nakabeppu, Takamitsu Suzuki: "Microscale temperature measurement by scanning thermal microscopy"J. Thermal Analysis and Calorimetry. 69. 727-737 (2002)
Osamu Nakabeppu、Takamitsu Suzuki:“通过扫描热显微镜测量微尺度温度”J。
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Osamu Nakabeppu, Takamitsu Suzuki, Takayoshi Inoue: "Development of real temperature measurement system on SThM"Proc. 39^<th> National Heat Transfer Conference in Japan. 2. 387-388 (2002)
Osamu Nakabeppu、Takamitsu Suzuki、Takayoshi Inoue:“SThM 上真实温度测量系统的开发”Proc。
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Osamu Nakabeppu, Takamitsu Suzuki: "Active and Passive Thermal Imaging in Scanning Thermal Microscopy"Proc. 6th ASME-JSME Thermal Engineering Joint Conference(CD-ROM). Al-304. (2003)
Osamu Nakabeppu、Takamitsu Suzuki:“扫描热显微镜中的主动和被动热成像”Proc。
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Osamu Nakabeppu, Takamitsu Suzuki: "Microscale temperature measurement by scanning thermal microscopy"J.Thermal Analysis and Calorimetry. 169. 727-737 (2002)
Osamu Nakabeppu、Takamitsu Suzuki:“通过扫描热显微镜进行微尺度温度测量”J.热分析与量热法。
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