Development of a Novel Ion-Current Semiconductor Detector for Distinguishing Incident Ions and Electrons

为了分析开场等离子体的末端损失离子能量，提出了一种基于金属收集器二次电子发射“自收集”原理的静电离子能谱仪。离子能谱仪设计了用于分析入射离子能量的多个网格，以及一组与开放式装置中环境磁力线平行放置的金属板。最重要的一个特征性质的光谱仪的使用我们提出的原则“self-collection”机制由于E×B飘接地金属板二次电子发射的收集器的使用不再附加磁系统除了环境开放式字段B原理和特性实验是由使用test-ion-beam线以及一个额外的亥姆霍兹线圈系统的使用形成与GAMMA 10端区相似的开放磁场。在伽玛10等离子体实验中，由于电子回旋加热产生的高能电子干扰了传统的末端损失离子探测器发出的离子信号，因此在同时入射的条件下，证明了所开发的离子能量谱仪在末端损失离子诊断中的应用。

For the purpose of end-loss-ion energy analyzes in open-field plasmas, a newly developed electrostatic ion-energy spectrometer is proposed on the basis of a "self-collection" principle for secondary electron emission from a metal collector. The ion-energy spectrometer is designed with multiple grids for analyzing incident ion energies, and a set of parallelized placed metal plates with respect to lines of ambient magnetic forces in an open-ended device. One of the most important characteristic properties of this spectrometer is the use of our proposed principle of a "self-collection" mechanism due to E×B drifts for secondary electrons emitted from the grounded metal-plate collector by the use of no further additional magnetic systems except the ambient open-ended fields B. The proof-of-principle and characterization experiments are carried out by the use of a test-ion-beam line along with an additional use of a Helmholtz coil system for the formation of open magnetic fields similar to those in the GAMMA 10 end region. The applications of the developed ion-energy spectrometer for end-loss-ion diagnostics in the GAMMA 10 plasma experiments are demonstrated under the conditions with simultaneous incidence of energetic electrons produced by electron-cyclotron heatings for end-loss-plugging potential formation, since these electrons have contributed to disturb these ion signals from conventional end-loss-ion detectors.