A study for feature extraction method of color image using color histogram space and its applications

(1)利用颜色频率信息进行高精度彩色纹理图像分割方法的研究为了对彩色纹理图像进行高精度的分割，需要准确地检测出纹理边缘。本研究提出了一种利用颜色直方图特征从边缘存在的小区域检测纹理边缘的方法。(2)利用颜色直方图改善彩色图像中局部曝光的方法本研究开发了一种对数字图像进行校正的技术，该数字图像像在实际看到人的图像中在背光下拍摄的图像一样存在极亮部分和暗部分。该技术通过使用获取的图像自动地创建与亮度不同的一幅图像，并使用两幅图像的该颜色频率信息来执行图像的曝光补偿。(3)利用多光谱光谱仪进行缺陷检测的研究进展对光进行频率分解后的多光谱可以获得常规RGB信息无法获得的颜色特征。本研究开发了我们开发的缺陷检测技术，对这种多光谱特征进行了频率信息的应用，并对这种多光谱特征进行了频率信息的应用，发展了对难以发现的缺陷进行检测的技术。

The main researches done in the 17 fiscal year are as follows.(1)Development of color texture image segmentation method with high accuracy using color frequency informationIt is necessary to detect texture edge correctly for highly precise segmentation of a color texture image. This research develops the method of detecting texture edge from the small area where edge exists correctly using the color histogram feature. This technique will have applied the character in which the color number contained in a small area becomes the maximum, if the optimal texture edge is detected.(2)Development of a method of improving local exposure in color image using a color histogramThis research develops the technology which rectifies the digital image with which an extremely bright portion and a dark portion exist like the picture taken under the backlight in a picture in which man is actually seen.This technique creates automatically one image from which brightness differs by using an acquired image, and performs exposure compensation of a image using this color frequency information of two images. This method is among patent application now.(3)Development of defect detection by using multi-spectrum spectroscopeThe multiple spectrum which carried out frequency decomposition of the light can acquire the color feature which was not acquired for the conventional RGB information.This research develops the technique of detecting the defect which we developed, which carries out frequency information application and which is hard to find it to this multiple-spectrum feature.Frequency information application is carried out to this multiple-spectrum feature, and this research develops the technique of detecting the defect which is hard to find it.