Production and Application of Highly Charged Secondary Ions by Heavy Ion Impact

用射弹离子-二次离子符合技术测量了1.05MeV/amu Ne^<q+>（q=2-10）和Ar^<q+>（q=4-14）射弹的Ne（Ar）二次离子产生截面。在不改变弹丸电荷、电子损失和俘获电离的情况下，符合测量能分辨出纯电离。通过电子丢失和俘获电离产生的二次离子的平均电荷状态与弹丸的总电荷变化截面进行了比较。实验结果表明，平均二次离子电荷态随入射入射粒子电荷q的增大而增大，随粒子中丢失和俘获电子数的增大而增大，而在丢失电离的低电荷态范围内，粒子的电荷变化截面随q的增大而急剧减小，在俘获电离的高电荷态范围内，粒子的电荷变化截面随q的增大而迅速增大.

Ne(Ar) secondary-ion production cross sections by projectiles of 1.05 MeV/amu Ne^<q+>(q=2-10) and Ar^<q+>(q=4-14) were measured using a projectile ion-secondary ion coincidence technique where the final charge states of both collision partners were detected simultaneously. The coincidence measurments were able to distingush pure ionization without any change of projectile charge, electron loss and capture ionization of projectiles. Average charge states of the secondary ions produced through electron loss and capture ionization were compared with total charge changing cross sections of projectiles. The present data indicated that the average seconday ion charge states increase with increasing the incident projectile charge q and the number of loss and capture electrons from/into projectiles whereas the charge changing cross sections of projectiles decrease steeply with increasing q in the range of low charge states for loss ionization and increase rapidly with increasing q in the range of high charge states for capture ionization.