Development of fundamental technique on high resolution electron microscopy and its applications

今年是本项目持续三年的最后一年。高压电子显微镜与常规电子显微镜相比，具有以下特点：(1)高分辨率，(2)高穿透功率，(3)便于原位实验，(4)辐射损伤研究等。近三年来，在仪器及其应用领域，如高分辨率电子显微镜，辐射损伤，原位实验，包括利用高能电子作为“微型实验室”创造新材料等，都取得了突出的成果。此外，京都大学、东北大学、东京大学和大阪大学等几所大学更新了高压电子显微镜。因此，我们期待着高压电子显微镜在材料科学和生物科学的广泛领域中的新发展。1991年11月28日和29日在名古屋kosei-nenkin kaikan举行的会议，除了介绍最近的研究工作外，还讨论了各大学和机构未来的高压电子显微镜计划。这些结果在1991年的年度报告中进行了总结。

This year is the last one for the present project continued three years. High voltage electron microscope is superior in the following characteristics in comparison with conventional electron microscope with the accerelating voltage of around 200 kV : (1) high resolution, (2) hogh penetration power, (3) facility of in-situ experiments, (4) study on the radiation damage, etc. In the last three years, several distinguished results in a field of the instrumentation as well as the application, such as high resolution electron microscopy, radiation damage, in-situ experiments including the creation of new materials by using the high energy electrons as "mini-labo" have been carried out. Furthermore, high voltage electron microscopes were renewed at several universities, Kyoto University, Tohoku University, Tokyo University and Osaka University. Accordingly, we expect the new developement on the high voltage electron microscopy in a wide field of materials science as well as the biological science.In 1991, it was held the meeting at 28th and 29th, November 1991 in Nagoya Kosei-nenkin Kaikan and discussed on the future plan of high voltage electron microscopy at each university and institution besides the presentation of recent research works. These results was summerized in the annual report of 1991.