Trial production of the curved crystal spectrometer for soft X-Ray Raman scattering spectroscopy

1.软X射线拉曼散射曲晶谱仪的性能评价：(1)扫描机构的精度、可靠性和分辨率的性能测试。用电子束作为激发源。用RAP(2d=26.12A)和ADP(2d=10.64A)晶体作为分析晶体。(2)研制了光谱仪的程序控制、数据测量和处理系统。系统由PC-9800个人计算机控制。在Si-K吸收边附近测量了Si、SiO_2的共振X射线发射谱(RXES)和Si-KLL共振俄歇谱(RAS)，在Y-LM吸收边测量了Y-1MMRAS对金属Y、YF_3和YCl3的影响。观察到在吸收峰能量处光谱强度共振增加，峰值能量随入射光子能量的变化呈现线性色散。此外，这些线条的形状是不对称的。因此，这些现象是由X射线共振拉曼散射引起的。

1.Performance evaluation of the curved crystal spectrometer for soft X-Ray Raman scattering spectroscopy.(1) Performance test for precision and reliability of a scanning mechanism and resolution of the spectrometer. An electron beam was used as an excitation source. RAP(2d=26.12A)and ADP(2d=10.64A)crystals were used as an analyzing crystal.(2) Preparation of a program control for the speetrometer, data measuring and processing systems.Systems were controled by a personal computer (PC-9800).Measurement of the soft X-Ray Raman scattering spectra.We have measured Si-K_<alpha> Resonant X-Ray Emission Spectra (RXES) and Si-KLL Resonant Auger Spectra (RAS) in the vicinity of Si-K absorption edge for Si, SiO_2 and also Y-LMM RAS in Y-Lm absorption edge for Y metal, YF_3 and YCI_3. RXES were measureed at undulator beam line BL-2A of photon Factory. It is observed that the intensity of the spectra increases resonantly at the absorption peak energy and the peak energy exhibits linear dispersion as a function of incident photon energy. Moreover, these line shapes are asymmetry. Therefore these phenomena are owing to X-Ray resonant Raman scattering.