Research on Concentration of Soft X-ray emitted from Z-pinch

利用技术玻璃科学研究所开发的X射线技术观测了日本大学喷气式Z箍缩装置发射的X射线辐射。喷气式Z箍缩发射具有宽波长的强X射线。观察是用玻璃毛细管转换器和X射线能谱仪进行的，玻璃毛细管转换器选择性地传播波长大于1 nm的软X射线，并将其会聚在1 mm以内的光斑内，对波长较短的硬X射线起过滤作用。利用这一特性，我们观察到了热等离子体的轮廓，消除了高能电子在外加电场加速下发射的硬X射线的影响。所制作的光谱仪体积小、结构简单，且易于通过更换晶体来改变测量长度。在晶体干涉仪中，测量了3.4- 4.6nm和小于1 nm的两个波长区域。两个辐射区都是从不同的地方发射的。以前的测量表明，X射线辐射是在不同的情况下从不同的地方发射的。结果表明，后一种辐射是从除电极表面以外的与不稳定性有关的热点发射的。在多层膜的光谱中，既观察到谱线，也观察到一维的特殊分布。由于我们的光谱照片是通过积分50-100次拍摄获得的，因此特殊分布的轮廓相当模糊。然而，对于更明亮的X射线源，将同时获得谱线和特殊轮廓。

The X-ray radiation emitted from the gas-puff Z-pinch device in Nihon University was observed by the X-ray technologies developed in the Scientific Institute of Technical Glass. The gas-puff Z-pinch emits intensive X-rays with a wide wave length. The observation was carried out by glass capillary converters and X-ray spectrometers.The glass capillary converter propagated selectedly the soft X-ray with longer wave length than 1 nm and converged it in a spot within 1 mm. It plays a role of filter for the hard X-ray with shorter wave length. Making use of this feature the thermal plasma profile was observed removing the effect of hard X-rays emitted by high energy electrons accelerated by the applied electric field.In the spectroscopy both crystal and multi-layr membrane were used for diffraction. The fabricated spectroscopy is small and simple, and it is easy to change the measuring length by replacing a crystal. In the crystal interferometer two wave length regions, 3.4-4.6 nm and less than 1 nm, were measured. Both regions of radiation were emitted from specially different place. The previous measurement showed that the X-ray radiation was emitted in different instance and from different place. The present result was consistent of it. The latter radiation was emitted from the hot spot relating with instabilities except the surface of the electrodes. In the spectroscopy with the multi-layr membrane, both spectral lines and one-dimensional, special distribution was observed. As our spectroscopic pictures were obtained by integrating 50-100 times shots, the profile of special distribution was quite ambiguous. However, both spectral lines and special profile will be obtained simultaneously for more bright X-ray source.