Yield measurement of secondary particles from liquid surface under heavy ion bombardment

为了测量包括液体材料在内的各种表面的次级粒子的绝对产额，我们进行了研究。首先，我们用玻璃毛细管测量了被引出的离子束的尺寸分布。结果，我们通过玻璃毛细管找到了粒度分布中的“晕”组分。为了获得无晕组分的离子束，我们发展了一种用金属毛细管提取离子束的技术和一种用这种毛细管进行空气中材料分析的技术。

We have studied in order to measure absolute yields of secondary particles from various surface including liquid material. At first we have measured size distributions of extracted ion beam using glass capillary. As a result, we have found the 'halo' components in size distributions via glass capillary. In order to obtain an ion beam without 'halo' components, we have developed an extraction technique of ion beam using an metal capillary and an in-air-material analysis technique with this capillary.