Energy analyzer and compact analysis chamber for high-resolution photoelectron spectroscopy

申请人的研究小组主要研究半导体衬底上超薄、外延生长的吸附质薄膜的合成和研究，从亚单层覆盖到薄膜厚度在10纳米范围内。科学兴趣特别集中在具有拓扑性质和电子相关性的二维原子单层的不寻常电子性质上。采用的主要实验方法是角分辨光电子能谱（ARPES）和扫描隧道显微镜与能谱（STM/STS）。由于其固有的表面特性，所有提到的薄膜系统都必须在原位（即完全在超高真空条件下）制造和研究。然而，目前可用的ARPES设备在动量和能量分辨率以及样品吞吐量方面已经达到了极限。出于这个原因，一个专门的，最先进的动量成像光电子分析仪量身定制的能力，我们新的高分辨率VUV源是采购。再加上分析真空室-样品机械手系统比现有系统明显更紧凑，克服了以往的局限性，并大大提高了研究机会。

The applicant's research group deals with the synthesis and investigation of ultra-thin, epitaxi-ally grown adsorbate films on semiconductor substrates, from sub-monolayer coverages to film thicknesses in the range of a few 10 nm. The scientific interest is focused in particular on the unusual electronic properties of 2D atomic monolayers with topological properties and electronic correlations. The main experimental methods used are angle-resolved photo-electron spectroscopy (ARPES) and scanning tunneling microscopy and spectroscopy (STM/STS). Due to their intrinsic surface character, all mentioned film systems have to be fabricated and investigated in situ (i.e., completely under ultra-high vacuum conditions). How-ever, the currently available ARPES facility is reaching its limits in terms of momentum and energy resolution as well as its sample throughput. For this reason, a dedicated, state-of-the-art momentum-imaging photoelectron analyzer tailored to the capabilities of our new high-resolution VUV source is to be procured. Together with an analysis vacuum chamber-sample manipulator system that is significantly more compact than the current system, the previous limitations are overcome and greatly improved research opportunities are opened up.