Fs magnetization dynamics of nanostructures probed by spin-polarized photoelectron emission microscopy (Fs-PEEM) and fs x-ray magnetic circular dichroism (Fs-XMCD)

磁电子学是信息技术的新兴战神之一，具有很大的发展潜力。在磁电子器件中，自旋相关的电荷输运性质，例如磁阻，用于信息处理、数据存储和传感器应用。在这样的设备中的非易失性数据存储需要磁性层的磁化反转。非易失性数据存储设备的日益小型化提供了大幅缩短读/写周期的机会。为了研究纳米结构中的物理现象和极限，有必要在飞秒时间尺度上研究纳米结构中的自旋动力学。我们建议这样做，结合激光飞秒泵浦-探测技术与光发射电子显微镜能够nm的空间分辨率。磁灵敏度是通过分析所发射的光电子的自旋极化来实现的。对磁性纳米结构和超薄膜的研究，以及与其他技术一起带来的“Schwerpunktprogramm”的承诺，第一次全面微观理解的过程，涉及自旋和电子动力学。

Magneto-electronics is one of the emerging ares of information technology with a large potential for future expansion. In magneto-electronic devices the spin dependent charge transport properties, such as the magneto-resistance, are used for information processing, data storage and sensor applications. Non-volatile data storage in such devices requires a magnetization reversal of a magnetic layer. The increasing miniaturization in non-volatile data storage devices offers the opportunity of a substantial shortening of the read/write cycles. In order to study the underlying physical phenomena and limits, it is necessary to probe the spin dynamics in nano structures on a fs time scale. We propose to do this by combining laser based fs pump-probe techniques with photo emission electron microscopy capable of nm spatial resolution. Magnetic sensitivity is achieved by analyzing the spin polarization of the emitted photo electrons. The study of magnetic nano structures and ultra thin films that are well characterized with other techniques brought together by this 'Schwerpunktprogramm' promises for the first time a comprehensive microscopic understanding of processes involving spin and electron dynamics.