Development of Stress Relaxation probe microscopy for Nanorheology Mapping

基于原子力显微镜（AFM），我开发了“AFM负载松弛测量技术”，其中AFM探针被推到样品表面上，然后保持该位置，以便测量松弛负载。实现了对弹性材料表面粘弹性和粘附力引起的松弛行为的定量测量。我还将该系统扩展到映射测量，以便粘弹性的分布可以在纳米级横向分辨率上可视化。该映射系统显示了应用于评估弹性体复合材料的纳米力学性能的能力。

Based on atomic force microscopy (AFM), I have developed “AFM load relaxation measurement technique," in which an AFM probe is pushed on a sample surface and then kept the position so that the relaxing load is measured. I fulfilled quantitative measurement of therelaxation behavior of elastic materials caused by viscoelasticity and adhesion of the surface. I also extended the system to mapping measurement so that the distribution of viscoelasticity can be visualized on nanoscale lateral resolution. The mapping system showed the capability of application to evaluate the nanomechanical properties of elastomer composite materials.