Development of system for measurement of phase refractive and group refractive dispersions by broadband interferometer

光学科学和工业中的许多领域都需要光学材料折射率及其色散的精确信息。测量不确定度在10-5到10-6量级的折射率的测量技术很少，而且这些技术只适用于单色光源，如激光器和光谱灯的发射线。因此，这些技术只提供某一波长的折射率，而不提供折射率色散。本文提出了一种直接测量位相折射率色散和群折射率色散的新技术。该技术由宽带光源、可变光路干涉仪、光路补偿系统和光谱仪组成。通过仿真验证了该方法的原理。

Precise information on refractive index and its dispersion of optical material is required in many fields of optical science and industry. There are only a few measurement techniques to measure refractive index with the order of 10-5 to 10-6 uncertainty and these techniques can be available only for monochromatic light source such as lasers and emission lines of spectral lamps. Therefore these techniques directly provide only the refractive index at a certain wavelength but don't provide refractive index dispersion.A new technique that directly measures phase refractive index dispersion and group refractive index dispersion is proposed. The technique is a combination of a broadband light source, variable path interferometer, optical path compensation system and a spectrometer. The principle of the proposed technique was confirmed by simulation.