Nanometer-resolved in situ observation of surface plasmons based on enhanced electron emission

我们已经解决了一种新的显微镜的发展，可视化的表面等离子体强度的金属表面上的纳米分辨率的基础上的二次电子发射增强效应。在扫描电子显微镜（SEM）的样品室中构造了一个光学系统，其中表面等离子体激元通过从外部提供的激光在沉积在棱镜上的金属薄膜上激发。观察SEM图像中对应于激光功率的强度变化。

We have tackled the development of a novel microscopy to visualize surface plasmon intensity on a metal surface with nanometeric resolution on the basis of the secondary electron emission enhancement effect. An optical system, in which surface plasmon is excited on a metal thin film deposited on a prism by laser light supplied from outside, was constructed in the specimen chamber of a scanning electron microscope (SEM). Intensity change in the SEM image corresponding to the laser power was observed.