Development of reference-less wavelength scanning interferometerfor micro aspherical lens
Development of reference-less wavelength scanning interferometerfor micro aspherical lens
批准号:
23656111
负责人:
HANAYAMA Ryohei
金额:
$2.58万
依托单位国家:
日本
项目类别:
Grant-in-Aid for Challenging Exploratory Research
财政年份:
2011
资助国家:
日本
项目状态:
已结题
起止时间:
2011 至 2012
中文摘要
在本研究中,我们发展了两种不同的干涉仪,其特点是不需要参考面。一种是极坐标剪切干涉仪,它实现了旋转和径向的波前剪切;另一种是零法干涉仪,它以空间光调制器为参考镜,通过零法扩展了动态范围。此外,还提出了相位检测算法的评价方法.对相位检测算法的改进有一定的帮助。
英文摘要
In this research, we developed two types of interferometercharacterized in that reference surface is not necessary. One is polar coordinate shearinginterferometer, which realizes wave front shearing for rotational and radial direction.Another is zero-method interferometer using spatial light modulator as a reference mirror.In the interferometer, the dynamic range was expanded by zero-methodology. Moreover, theevaluation method of phase detection algorithms were also developed. It is of assistance ofimprovement of phase detection algorithms.
期刊论文(0)
专著(0)
科研奖励(0)
会议论文
登录
查看更多内容
空間位相変調器を用いた零位法干渉計の開発
空间相位调制器零位法干涉仪的研制
DOI:
--
发表时间:
2012
期刊:
影响因子:
--
作者:
[Satoshi Kanai, Takayuki Shibata and Takahiro Kawashima, 花山良平,石井勝弘]
通讯作者:
花山良平,石井勝弘
Development of a zero-method interferometer bymeans of dynamic generation of reference wavefront
动态生成参考波前研制零法干涉仪
DOI:
--
发表时间:
2013
期刊:
影响因子:
--
作者:
[Ryohei Hanayama, Katsuhiro Ishii]
通讯作者:
Katsuhiro Ishii
Development of a zero-method interferometer by means of dynamic generation of reference wave front
动态生成参考波前研制零法干涉仪
DOI:
--
发表时间:
2013
期刊:
影响因子:
--
作者:
[Ryohei Hanayama, Katsuhiro Ishii, Tomohiro Mizoguchi, 花山 良平]
通讯作者:
花山 良平
Error estimation of phase detection algorithms and comparison of window functions Error analysis of phase detection algorithms in the frequency domain
相位检测算法的误差估计及窗函数比较 频域相位检测算法的误差分析
DOI:
--
发表时间:
2012
期刊:
影响因子:
--
作者:
[Satoshi Kanai, Takayuki Shibata and Takahiro Kawashima, 花山良平,石井勝弘, Satoshi Kanai, R. Hanayama and K. Hibino]
通讯作者:
R. Hanayama and K. Hibino
Constraction of a reliable shape measurement system using interferometry and phase measurement deflectometry
-
批准号:25820025
-
项目类别:Grant-in-Aid for Young Scientists (B)
-
资助金额:$2.75万
-
财政年份:2013
-
负责人:HANAYAMA Ryohei
-
依托单位:
海外基金