Structural control and local optical property of carbon nanotube adsorbed on the substrates

碳纳米管(CNTs)的光学性质是当前电子器件小型化研究的热点。为了发展基于碳纳米管的电子学，对单个碳纳米管进行纳米级的分析和控制是必不可少的。在这里，我们使用扫描隧道显微镜(STM)在碳纳米管链上制造了一个原子尺度的缺陷。此外，利用STM针尖诱导光发射(STM-LE)方法对碳纳米管表面人工缺陷的光学性质进行了讨论。采用干式接触转移(DCT)方法在不暴露于空气中的情况下在衬底上沉积碳纳米管。我们开发这种方法是为了增加碳纳米管在衬底上的密度。通过将STM针尖放置在CNT上方，然后施加电压脉冲，在CNT上产生人工缺陷。与Au相比，单壁碳纳米管和缺陷发出的光相对较弱。此外，当在碳纳米管缺陷处获得STM-LE时，完整碳纳米管的STM-LE谱中的强峰向更高的能量方向移动。这可能归因于STM针尖引起的碳纳米管电子态的变化。

Optical properties of carbon nanotubes (CNTs) are currently the focus of intense study in relation to the miniaturization of electronic devices. In order to develop electronics based on the CNT, the nano-scale analysis and control of the individual CNT are indispensable. Here, we used scanning tunneling microscopy (STM) to create an atomic-scale defect on the CNT chain. Furthermore, the optical property of the artificial defect formed on CNT has been discussed using the STM tip-induced light emission (STM-LE) method. The dry contact transfer (DCT) method was used to deposit CNTs on the substrates without exposing the sample to air. We have developed this method in order to increase the density of CNT on the substrate. The artificial defect was created on the CNT by positioning the STM tip above the CNT followed by applying the voltage pulse. The light emitted from the SWCNT and the defect was found to be relatively weak compared with that from Au. Moreover, the intense peak observed in the STM-LE spectrum of the intact CNT is shifted to higher energy when the STM-LE was obtained at the defect site of CNT. This would be ascribed to the change in the electronic states of CNT, which was induced by the STM tip.